Articles | Volume 11, issue 1
https://doi.org/10.5194/tc-11-483-2017
© Author(s) 2017. This work is distributed under
the Creative Commons Attribution 3.0 License.Active-layer thickness estimation from X-band SAR backscatter intensity
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- Final revised paper (published on 10 Feb 2017)
- Preprint (discussion started on 31 Aug 2016)
Interactive discussion
AC: Author comment | RC: Referee comment | SC: Short comment | EC: Editor comment
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RC1: 'Review of Widhalm et al. version 1', Anonymous Referee #1, 20 Sep 2016
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AC1: 'Reply to Referee 1', Barbara Widhalm, 28 Sep 2016
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AC1: 'Reply to Referee 1', Barbara Widhalm, 28 Sep 2016
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RC2: 'Review', Anonymous Referee #2, 21 Sep 2016
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AC2: 'Reply to Referee 2', Barbara Widhalm, 28 Sep 2016
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AC2: 'Reply to Referee 2', Barbara Widhalm, 28 Sep 2016
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SC1: 'Logical structure of the manuscript', Marco G. Jorge, 23 Sep 2016
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RC3: 'ALT and X-Band Backscatter', Anonymous Referee #1, 23 Sep 2016
Peer-review completion
AR: Author's response | RR: Referee report | ED: Editor decision
AR by Barbara Widhalm on behalf of the Authors (26 Nov 2016)
Author's response
Manuscript
ED: Publish subject to technical corrections (12 Jan 2017) by Andreas Kääb
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AR by Barbara Widhalm on behalf of the Authors (17 Jan 2017)
Author's response
Manuscript