Articles | Volume 14, issue 5
https://doi.org/10.5194/tc-14-1651-2020
© Author(s) 2020. This work is distributed under
the Creative Commons Attribution 4.0 License.Snow albedo sensitivity to macroscopic surface roughness using a new ray-tracing model
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- Final revised paper (published on 27 May 2020)
- Preprint (discussion started on 30 Aug 2019)
Interactive discussion
AC: Author comment | RC: Referee comment | SC: Short comment | EC: Editor comment
- Printer-friendly version
- Supplement
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RC1: 'Review comments of Larue et al.', Anonymous Referee #1, 20 Nov 2019
- AC1: 'Answer to reviewer 1', Fanny Larue, 12 Mar 2020
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RC2: 'Minor revisions', Anonymous Referee #2, 15 Jan 2020
- AC2: 'Answer to reviewer 2', Fanny Larue, 12 Mar 2020
- AC3: 'Letter to editor', Fanny Larue, 12 Mar 2020
Peer-review completion
AR: Author's response | RR: Referee report | ED: Editor decision
ED: Publish subject to minor revisions (review by editor) (17 Mar 2020) by Mark Flanner
AR by Fanny Larue on behalf of the Authors (23 Mar 2020)
Author's response
Manuscript
ED: Publish as is (31 Mar 2020) by Mark Flanner
AR by Fanny Larue on behalf of the Authors (08 Apr 2020)
Author's response