Articles | Volume 20, issue 7
https://doi.org/10.5194/tc-20-4185-2026
© Author(s) 2026. This work is distributed under the Creative Commons Attribution 4.0 License.
Comparing high spatial and temporal resolution snow depth measurements and modelling results in an avalanche release area
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- Final revised paper (published on 28 Jul 2026)
- Preprint (discussion started on 13 Feb 2026)
Interactive discussion
Status: closed
Comment types: AC – author | RC – referee | CC – community | EC – editor | CEC – chief editor
| : Report abuse
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RC1: 'Comment on egusphere-2026-485', Anonymous Referee #1, 19 Apr 2026
- AC1: 'Reply on RC1', Pia Ruttner, 28 May 2026
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RC2: 'Comment on egusphere-2026-485', Alexander Prokop, 14 May 2026
- AC2: 'Reply on RC2', Pia Ruttner, 28 May 2026
Peer review completion
AR – Author's response | RR – Referee report | ED – Editor decision | EF – Editorial file upload
ED: Submit a revised manuscript (12 Jun 2026) by Heather Reese
AR by Pia Ruttner on behalf of the Authors (21 Jun 2026)
Author's response
Author's tracked changes
Manuscript
ED: Publish subject to minor revisions (review by editor) (29 Jun 2026) by Heather Reese
AR by Pia Ruttner on behalf of the Authors (30 Jun 2026)
Author's response
Author's tracked changes
Manuscript
ED: Publish as is (16 Jul 2026) by Heather Reese
AR by Pia Ruttner on behalf of the Authors (21 Jul 2026)
Manuscript
General Comments
This manuscript presents an interesting study on comparing high spatial and temporal resolution snow depth measurements and modelling results in an avalanche release area. The manuscript is generally well written, and the overall structure is clear. I particularly appreciate the authors’ efforts in continuous ground/near-surface observations of mountain snow and in linking these observations with a modelling approach for spatio-temporal mapping, which is especially valuable given the significant data gaps and research challenges in complex mountain environments.
However, there are some issues that should be addressed before the manuscript can be considered for publication. In particular:
Specific Comments