Articles | Volume 10, issue 3
Research article
19 May 2016
Research article |  | 19 May 2016

Sensitivity of snow density and specific surface area measured by microtomography to different image processing algorithms

Pascal Hagenmuller, Margret Matzl, Guillaume Chambon, and Martin Schneebeli


Interactive discussion

Status: closed
Status: closed
AC: Author comment | RC: Referee comment | SC: Short comment | EC: Editor comment
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Peer-review completion

AR: Author's response | RR: Referee report | ED: Editor decision
AR by Pascal Hagenmuller on behalf of the Authors (11 Apr 2016)  Author's response    Manuscript
ED: Publish as is (02 May 2016) by Philip Marsh
Short summary
The paper focuses on the characterization of snow microstructure with X-ray microtomography, a technique that is progressively becoming the standard for snow characterization. In particular, it rigorously investigates how the image processing algorithms affect the subsequent microstructure characterization in terms of density and specific surface area. From this analysis, practical recommendations concerning the processing X-ray tomographic images of snow are provided.