Articles | Volume 10, issue 3
https://doi.org/10.5194/tc-10-1039-2016
https://doi.org/10.5194/tc-10-1039-2016
Research article
 | 
19 May 2016
Research article |  | 19 May 2016

Sensitivity of snow density and specific surface area measured by microtomography to different image processing algorithms

Pascal Hagenmuller, Margret Matzl, Guillaume Chambon, and Martin Schneebeli

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AR: Author's response | RR: Referee report | ED: Editor decision
AR by Pascal Hagenmuller on behalf of the Authors (11 Apr 2016)  Author's response    Manuscript
ED: Publish as is (02 May 2016) by Philip Marsh
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Short summary
The paper focuses on the characterization of snow microstructure with X-ray microtomography, a technique that is progressively becoming the standard for snow characterization. In particular, it rigorously investigates how the image processing algorithms affect the subsequent microstructure characterization in terms of density and specific surface area. From this analysis, practical recommendations concerning the processing X-ray tomographic images of snow are provided.